- Place of Origin: Guangdong, China (Mainland)
- Brand Name: MITECH
- Model Number: MFD650C
- Color:: Black
- Memory:: Total 1000 datasets store
- Communication:: USB2.0 high-speed
- Range:: 0 ~ 9999 mm
- Material Velocity:: 300 ~ 15000 m / s
- Vertical linear error:: ≤ 2.5%
- Horizontal linear error:: ≤ 0.1%
- Power supply:: DC 9V; lithium batteries
- Channels:: 100 channels
- Connect Interface:: Lemo/BNC
Packaging & Delivery
|Packaging Details:||export carton|
|Delivery Detail:||3 Days|
SpecificationsMITECH MFD650C PORTABLE DIGITAL ULTRASONIC FLAW DETECTOR APARELHO DE ULTRASSOM
MFD650C Portable Ultrasonic Flaw Detector with hi-resolution color TFT LCD display.
The background color and the wave color can be selectable according to the environment. LCD brightness can be manually set. Continue working over 8 hours with high performance lithium-ion battery module (with large capacity lithium-ion battery option), easy to be dismantled and the battery module can be charged independently offline. It is light and portable, easily to be taken by one hand; easy operation; superior reliability makes it long life.
0~ 9999mm (at steel velocity); range selectable in fixed steps or continuously variable.
Spike excitation with low, middle and high choices of the pulse energy.
Pulse Repetition Rate: manually adjustable from 10 to 1000 Hz.
Pulse width: Adjustable in a certain range to match different probes.
Damping: 200Ω, 300Ω, 400Ω, 500Ω, 600Ωselectable to meet different resolution and sensitivity need.
Probe work mode: Single element, dual element and through transmission;
Real-time sampling at 160MHz high speed enough to record the defect information.
Rectification: Positive half wave, negative halfwave, full wave, and RF
DB Step: 0dB, 0.1 dB, 2dB, 6dB step value as well as auto-gain mode
Alarm with sound and light,.
Total 100 configuration channels store all instrument operating parameters plus DAC/AVG curve; stored configuration data can be easily previewed and recalled for quick, repeatable instrument setup. Total 1000 datasets store all instrument operating parameters plus A-scan. All the configuration channels and datasets can be transferred to PC via USB port.
Automatically searching the peak wave inside the gate and hold it on the display.
Equivalent diameter calculation: find out the peak echo and calculate its equivalent diameter.
Continuous Record: Record the display continuously and save it to the memory inside the instrument.
Defect Localization: Localize the defect position, including the distance, the depth and its plane projection distance.
Defect Sizing: calculate the defect size
Defect Evaluation: Evaluate the defect by echo envelope.
DAC: Distance Amplitude Correction
AVG: Distance Gain Size curve function
Crack measure: Measure and calculate the crack depth
B-SCAN: Display the cross-section of the test block.
Real time clock for tracking the time.
USB2.0 high-speed communication port
Channels: 100 channels
Range: (0 ~ 9999) mm
Bandwidth: (0.5 ~ 15) MHz
Material Velocity: (300 ~ 15000) m / s
Dynamic Range: ≥ 36dB
Vertical linear error: ≤ 2.5%
Horizontal linear error: ≤ 0.1%
Resolution:> 40dB (5P14)
Sensitivity Leavings: 65dB (flat-bottomed deep hole 200mmΦ2)
Rejection: (0 to 80)% Linear
Noise level: ≤ 8%
Power supply: DC 9V; lithium batteries work for 8 hours or more
Ambient temperature: (-20 ~ 50) °C
Relative Humidity: (20 ~ 95)% RH
Overall dimensions: 263 × 170 × 61 (mm)
Straight Beam Probe 4P,10mm
Angle Probe 4P 8*9 60°
Power Adapter (Charger)
USB communication Cable